Bare
board test probe |
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In-circuit
test probe |
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IC test probe |
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ND118G-410
series |
4.75(0.187)
Test Center
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Double Ended Probe
Specification |
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= ELECTRICAL (Static Conditions) |
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= MATERIAL and FINISHES |
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Plunger :Heat-treated Berllium copper, |
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Gold plated over
nickel |
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(Optional Rhodium
plated over nickel) |
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Barrel : Brass or Phosphor Bronze |
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Gold plated(ID, and OD) over
nickel |
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Spring : Music wire or Stainless wire
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SPRING FORCE
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Preload
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2/3 Travel
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Full Travel
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grams (± 20%)
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15
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40(3.2st)
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60(5.0st)
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7
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36(2.5st)
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43(3.0st)
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